Search results for: Stefan Dreiner
IEEE Journal of the Electron Devices Society > 2018 > 6 > 1 > 74 - 80
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 21 - 29
IEEE Journal of the Electron Devices Society > 2018 > 6 > 1 > 74 - 80
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 21 - 29