Search results for: Shi Yu
IEEE Design & Test > 2016 > 33 > 6 > 23 - 30
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2015 > 34 > 12 > 2039 - 2048
IEEE Design & Test > 2016 > 33 > 6 > 23 - 30
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2015 > 34 > 12 > 2039 - 2048