Search results for: Tian-Li Wu
Microelectronics Reliability > 2014 > 54 > 9-10 > 2232-2236
IEEE Transactions on Power Electronics > 2014 > 29 > 5 > 2199 - 2207
2013 IEEE International Reliability Physics Symposium (IRPS) > 3C.5.1 - 3C.5.7
IEEE Transactions on Electron Devices > 2013 > 60 > 10 > 3132 - 3141
IEEE Electron Device Letters > 2009 > 30 > 9 > 957 - 959