Search results for: Chenhsin Lien
Solid-State Electronics > 2017 > 132 > C > 80-85
IEEE Transactions on Electron Devices > 2016 > 63 > 12 > 4603 - 4609
IEEE Transactions on Electron Devices > 2015 > 62 > 12 > 4135 - 4138
IEEE Electron Device Letters > 2015 > 36 > 9 > 929 - 931
IEEE Transactions on Electron Devices > 2015 > 62 > 6 > 1958 - 1963
Microelectronics Reliability > 2015 > 55 > 1 > 74-80
IEEE Transactions on Nanotechnology > 2013 > 12 > 5 > 760 - 765
IEEE Transactions on Electron Devices > 2012 > 59 > 6 > 1614 - 1620
IEEE Transactions on Electron Devices > 2011 > 58 > 4 > 1257 - 1263
IEEE Electron Device Letters > 2011 > 32 > 11 > 1477 - 1479
IEEE Electron Device Letters > 2011 > 32 > 11 > 1585 - 1587
IEEE Electron Device Letters > 2011 > 32 > 3 > 390 - 392
Thin Solid Films > 2010 > 518 > 21 > 6076-6079
IEEE Electron Device Letters > 2010 > 31 > 12 > 1473 - 1475
Thin Solid Films > 2009 > 517 > 24 > 6850-6852