Search results for: Yin-Nien Chen
IEEE Transactions on Electron Devices > 2015 > 62 > 1 > 107 - 113
Microelectronics Reliability > 2014 > 54 > 4 > 698-711
IEEE Journal on Emerging and Selected Topics in Circuits and Systems > 2014 > 4 > 4 > 389 - 399
IEEE Transactions on Electron Devices > 2014 > 61 > 10 > 3448 - 3455
IEEE Transactions on Circuits and Systems I: Regular Papers > 2014 > 61 > 12 > 3339 - 3347
2013 IEEE International Reliability Physics Symposium (IRPS) > CR.1.1 - CR.1.5