Search results for: J. Wang
IEEE Electron Device Letters > 2017 > 38 > 9 > 1339 - 1342
2016 IEEE International Electron Devices Meeting (IEDM) > 36.5.1 - 36.5.4
2016 IEEE International Electron Devices Meeting (IEDM) > 2.7.1 - 2.7.4
2012 IEEE International Reliability Physics Symposium (IRPS) > GD.3.1 - GD.3.4
IEEE Transactions on Electron Devices > 2011 > 58 > 6 > 1583 - 1593
IEEE Transactions on Electron Devices > 2011 > 58 > 9 > 2959 - 2965
2010 International Electron Devices Meeting > 27.3.1 - 27.3.4