Search results for: J.J. Liou
Microelectronics Reliability > 2015 > 55 > 6 > 873-878
Solid State Electronics > 2011 > 63 > 1 > 22-26
Solid State Electronics > 2010 > 54 > 6 > 635-641
IEEE Transactions on Electron Devices > 2010 > 57 > 4 > 814 - 819
IEEE Electron Device Letters > 2009 > 30 > 9 > 969 - 971
2009 31st EOS/ESD Symposium > 1 - 7
2009 31st EOS/ESD Symposium > 1 - 11
Microelectronics Reliability > 2009 > 49 > 1 > 13-16
IEEE Electron Device Letters > 2008 > 29 > 4 > 360 - 362
IEEE Electron Device Letters > 2008 > 29 > 7 > 753 - 755
IEEE Transactions on Electron Devices > 2008 > 55 > 12 > 3517 - 3524