Search results for: G. Gasiot
Microelectronics Reliability > 2017 > 76-77 > C > 53-57
Microelectronics Reliability > 2015 > 55 > 9-10 > 1506-1511
2015 IEEE International Reliability Physics Symposium > SE.12.1 - SE.12.4
Microelectronics Reliability > 2014 > 54 > 9-10 > 2278-2283
Microelectronics Reliability > 2014 > 54 > 8 > 1455-1476
2014 IEEE International Reliability Physics Symposium > 5F.5.1 - 5F.5.6
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 3527 - 3534
IEEE Transactions on Nuclear Science > 2014 > 61 > 3-2 > 1498 - 1500
2013 IEEE International Reliability Physics Symposium (IRPS) > 6C.1.1 - 6C.1.7
2013 IEEE International Reliability Physics Symposium (IRPS) > 3D.4.1 - 3D.4.8
2012 IEEE International Reliability Physics Symposium (IRPS) > 3C.5.1 - 3C.5.9
IEEE Transactions on Nuclear Science > 2012 > 59 > 6-1 > 2914 - 2919
IEEE Transactions on Nuclear Science > 2012 > 59 > 6-1 > 2658 - 2665
IEEE Transactions on Nuclear Science > 2011 > 58 > 3-2 > 1086 - 1092
Microelectronics Reliability > 2010 > 50 > 9-11 > 1822-1831