Search results for: Yong-Jin Seo
Microelectronics Reliability > 2013 > 53 > 2 > 205-207
Electronic Materials Letters > 2012 > 8 > 1 > 81-85
Electronic Materials Letters > 2012 > 8 > 5 > 523-528
Value in Health > 2011 > 14 > 4 > 475-482
Microelectronic Engineering > 2011 > 88 > 1 > 46-52
Transactions of Nonferrous Metals Society of China > 2009 > 19 > Supplement 1 > s262-s265
Microelectronics Journal > 2009 > 40 > 2 > 299-302
Microelectronic Engineering > 2008 > 85 > 8 > 1776-1780
Microelectronic Engineering > 2008 > 85 > 4 > 682-688
Microelectronic Engineering > 2007 > 84 > 12 > 2769-2774
Microelectronic Engineering > 2007 > 84 > 12 > 2896-2900
Microelectronic Engineering > 2007 > 84 > 1 > 161-164
Microelectronic Engineering > 2006 > 83 > 11-12 > 2238-2242
Microelectronic Engineering > 2006 > 83 > 11-12 > 2213-2217
Thin Solid Films > 2006 > 504 > 1-2 > 166-169
Thin Solid Films > 2006 > 504 > 1-2 > 261-264