Search results for: S.G. Beebe
IEEE Transactions on Electron Devices > 2010 > 57 > 3 > 644 - 653
2009 IEEE Custom Integrated Circuits Conference > 681 - 688
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 292 - 299
IEEE Transactions on Electron Devices > 2010 > 57 > 3 > 644 - 653
2009 IEEE Custom Integrated Circuits Conference > 681 - 688
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 292 - 299