Search results for: Mi-Chang Chang
Microelectronics Reliability > 2017 > 74 > C > 110-117
IEEE Transactions on Electron Devices > 2008 > 55 > 1 > 84 - 95
Solid State Electronics > 2003 > 47 > 5 > 865-871
Microelectronics Reliability > 2017 > 74 > C > 110-117
IEEE Transactions on Electron Devices > 2008 > 55 > 1 > 84 - 95
Solid State Electronics > 2003 > 47 > 5 > 865-871