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Test for a FPGA is supposed to consist of two steps, namely configuration and fault scan. The process of configuration and fault scan is required to be repeated many times before all resources of a FPGA-under-test are covered. Traditional test schemes for a FPGA-under-test involve a large amount of manual work. An automatic test approach for a FPGA-under-test implemented by an in-house SOC co-verification...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.