Search results for: D. Miura
Microelectronics Reliability > 2017 > 76-77 > C > 405-408
Microelectronics Reliability > 2016 > 64 > C > 287-293
Microelectronics Reliability > 2016 > 64 > C > 484-488
Nuclear Inst. and Methods in Physics Research, A > 2012 > 661 > Supplement 1 > S206-S209
IEEE Transactions on Nuclear Science > 2010 > 57 > 4-2 > 2210 - 2214
Applied Surface Science > 2005 > 251 > 1-4 > 205-209