Search results for: G. Pourtois
Journal of Microscopy > 268 > 3 > 276 - 287
Applied Surface Science > 2017 > 416 > C > 853-857
2016 IEEE International Electron Devices Meeting (IEDM) > 25.1.1 - 25.1.4
physica status solidi (RRL) – Rapid Research Letters > 10 > 11 > 787 - 791
2015 IEEE International Electron Devices Meeting (IEDM) > 21.6.1 - 21.6.4
IEEE Electron Device Letters > 2015 > 36 > 8 > 769 - 771
2014 IEEE International Reliability Physics Symposium > PI.2.1 - PI.2.5
Physica E: Low-dimensional Systems and Nanostructures > 2014 > 56 > Complete > 416-421
Applied Surface Science > 2014 > 291 > Complete > 98-103
Applied Surface Science > 2014 > 291 > Complete > 104-108
Applied Surface Science > 2014 > 291 > Complete > 113-117
IEEE Electron Device Letters > 2013 > 34 > 3 > 402 - 404