Search results for: Xin Li
Proceedings of the 33rd Chinese Control Conference > 7450 - 7455
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 262 - 267
IEEE Transactions on Image Processing > 2014 > 23 > 8 > 3618 - 3632
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 600 - 606
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 258 - 265