Search results for: C. Harendt
2010 International Electron Devices Meeting > 2.5.1 - 2.5.4
IEEE Journal of Solid-State Circuits > 2009 > 44 > 1 > 281 - 289
Materials Science & Engineering B > 1995 > 29 > 1-3 > 13-17
2010 International Electron Devices Meeting > 2.5.1 - 2.5.4
IEEE Journal of Solid-State Circuits > 2009 > 44 > 1 > 281 - 289
Materials Science & Engineering B > 1995 > 29 > 1-3 > 13-17