Search results for: Y. Kondo
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 142 - 148
Engineering Failure Analysis > 2009 > 16 > 6 > 1968-1976
IEEE Transactions on Electron Devices > 2007 > 54 > 10 > 2644 - 2649
IEEE Transactions on Electron Devices > 2007 > 54 > 8 > 1852 - 1859