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We describe a near-field nanoimaging method employed to spatially map the current-induced excess noise occurring in a bilayer graphene constriction with passive scanning near-field microscope (s-SNOM). We find that the excess noise, manifesting itself as fluctuating electromagnetic evanescent fields generated on the sample surface, is discernible only in the constricted region and increases linearly...
We have developed a passive THz s-SNOM (scattering-type scanning near-field optical microscope) equipped with a helium-free cryostat. The mechanical vibration from the compressor is reduced for accurately controlling the probe-sample distance. Besides, the confocal system with a solid immersion lens leads to gather higher signal-to-noise ratio. To demonstrate the capability of the s-SNOM, we measured...
Er3+-TeO2 thin film photonics crystals (PhCs) demonstrates anisotropic photoluminescence (PL) emission. By tuning the PhC periodicity, surface extraction mode or waveguide propagation mode can be selected which provides flexible on-chip light source.
This paper reports a silicon-based micromachined optical power detector with on-chip measurement ability. The optical power is detected by an integrated electron-tunneling displacement transducer, in which optical force is employed as the bridge between optical energy and mechanical energy transition. Compared with the traditional optical power detectors, which are based on photo absorption, the proposed...
In this paper, an optical switch driven by the optical force is demonstrated based on Nanoelectromechanical system (NEMS) technology. The switch consists of a Mach-Zehnder interferometer (MZI) and a ring resonator. One of the MZI arms is suspended to enable optical switching by optical force induced displacement. The optical force is introduced by injecting a control light into the ring resonator...
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