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A comparative investigation of the reliability of 60Coγ ray irradiation on bulk-Si substrate and SOI substrate double polysilicon self-aligned (DPSA) NPN bipolar transistors is presented. Bulk silicon based DPSA NPN transistors show severe current gain degradation at low injection level, and a monotonic increase in current gain degradation with decreasing Emitter-Base (E-B) voltage is observed. SOI...
In this thesis, electrochemical corrosion and electrochemical migration characteristics of 64Sn-35Bi-1Ag (SBA) solder with In doping in 3wt.% NaCl solution are researched by potentiodynamic polarization measurement and a self-designed experiment, respectively. The surface morphology and elemental composition of corrosive products and dendrites during ECM process are determined by SEM, EDAX techniques...
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