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Post-silicon validation and debug have gained importance in recent years to track down errors that have escaped the pre-silicon phase. Limited observability of internal signals during post-silicon debug necessitates the storage of signal states in real time. Trace buffers are used to store these states. To increase the debug observation window, it is essential to compress these trace signals, so that...
Directed test generation is important for the functional verification of complex system-on-chip designs. SAT based bounded model checking is promising for counter example generation which can be used in directed testing. Existing research has explored two directions to accelerate the SAT solving process: learning during solving of one property with different bounds, or solving multiple properties...
SystemC transaction level modeling (TLM) is widely used to reduce the overall design and validation effort of complex system-on-chip (SOC) architectures. Due to lack of efficient techniques, the amount of reuse between abstraction levels is limited in many scenarios such as reuse of TLM level tests for RTL validation. This paper presents a top-down methodology for generation of RTL tests from SystemC...
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