Search results for: Y.-L. Shen
Microelectronics Reliability > 2016 > 61 > C > 48-55
Materials Letters > 2016 > 168 > C > 129-133
Constrained Deformation of Materials > 263-274
Constrained Deformation of Materials > 77-123
Constrained Deformation of Materials > 169-262
Constrained Deformation of Materials > 125-168
Procedia Engineering > 2016 > 139 > C > 101-111
Procedia Engineering > 2016 > 139 > C > 93-100
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 629 - 632
Journal of Materials Science > 2015 > 50 > 3 > 1394-1400
Thin Solid Films > 2014 > 570 > Part B > 235-242
Thin Solid Films > 2014 > 561 > Complete > 108-113