The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
We present DC and TLP data of four-terminal SCR devices and a diode-triggered SCR from an advanced SOI CMOS technology. Data analysis concludes that the triggering of an actively triggered SCR is related only to the current gain of each individual bipolar transistor, not the current gain product. Successful current sustaining of the SCR depends on the base resistance of its passively triggered bipolar...
In this paper, the circuitry implementation of an electricity high ac current measurement system is introduced. Both high breakdown voltage tolerance and high measurement accuracy are achieved by applying the fiber optical sensor and an appropriate precision pre-amplifier with offset cancellation. The discussion is focus on the design of the pre-amplifier while the digital section of this system is...
Overshoot voltages during VFTLP testing of DTSCRs are investigated. The DTSCRs in a 65 nm process turn on at approximately 500 ps. The overshoot voltages from DTSCRs are shown to cause gate oxide failures when gate oxide monitors were added in parallel to DTSCR ESD devices. Scaling trends show DTSCRs turning on at approximately 150 ps when technologies are scaled down to the 32 nm node.
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.