Search results for: H. Wang
Journal of Oral Rehabilitation > 45 > 3 > 191 - 197
Microelectronics Reliability > 2016 > 64 > C > 403-408
2011 International Reliability Physics Symposium > 6B.1.1 - 6B.1.5
2010 International Electron Devices Meeting > 27.1.1 - 27.1.4
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control > 1995 > 42 > 4 > 774 - 781