Search results for: H. Wang
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 335 - 341
IEEE Photonics Journal > 2013 > 5 > 5 > 8200508
IEEE Electron Device Letters > 2011 > 32 > 8 > 1098 - 1100
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 335 - 341
IEEE Photonics Journal > 2013 > 5 > 5 > 8200508
IEEE Electron Device Letters > 2011 > 32 > 8 > 1098 - 1100