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We present an ellipsometric analysis to model the order-disorder transition in nano-granular gold embedded in a silica matrix (Au-SiO2). The optical measurements were performed by means of Reflection Spectroscopic Ellipsometry (RSE) over the spectral wavelength range 300–2500 nm. Upon thermal annealing of Au-SiO2 in the temperature range of 200 to 800 °C, a clear order-disorder textural transition...
We present a systematic study of the surface resistance of perovskite thin films and bulk samples at microwave frequencies. The d.c. resistivity p of the various samples spans three orders of magnitude. For bulk samples, we obtain the usual p 1/2 dependence of R s . For p < 1 μΩ cm, R s displays conventional behavior, i.e. R s αp. However, for p > 1...
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