Search results for: Haipeng Fu
Microwave and Optical Technology Letters > 66 > 1 > n/a - n/a
Microwave and Optical Technology Letters > 65 > 10 > 2763 - 2771
Microwave and Optical Technology Letters > 64 > 11 > 1972 - 1977
Microwave and Optical Technology Letters > 64 > 10 > 1694 - 1699
Microwave and Optical Technology Letters > 64 > 6 > 1036 - 1041
Microwave and Optical Technology Letters > 64 > 6 > 1042 - 1047
Microwave and Optical Technology Letters > 64 > 2 > 338 - 343
Microwave and Optical Technology Letters > 63 > 3 > 798 - 804
Journal of Electronic Testing > 2017 > 33 > 1 > 133-140
International Journal of RF and Microwave Computer‐Aided Engineering > 26 > 6 > 481 - 488
Journal of Electronic Testing > 2016 > 32 > 4 > 481-489
Analog Integrated Circuits and Signal Processing > 2016 > 89 > 1 > 177-183
IEEE Transactions on Circuits and Systems I: Regular Papers > 2014 > 61 > 3 > 699 - 711
IEEE Transactions on Terahertz Science and Technology > 2014 > 4 > 6 > 686 - 695