# Search results for: Ajit Chaturvedi

Journal of Statistical Theory and Practice > 2019 > 13 > 1 > 1-41

*R*(

*t*) =

*P*(

*X*>

*t*) and

*P*=

*P*(

*X*>

*Y*). Point and interval estimation procedures are developed for unknown parameter(s),

*R*(

*t*) and

*P*, based on records. Two types of point estimators are considered, namely (1) uniformly minimum variance unbiased estimators...

International Journal of System Assurance Engineering and Management > 2018 > 9 > 6 > 1260-1278

International Journal of System Assurance Engineering and Management > 2017 > 8 > 2 > 836-848

*R*(

*t*) =

*P*(

*X*>

*t*) and

*P*=

*P*(

*X*>

*Y*). Point estimation and testing procedures are developed for

*R*(

*t*) and

*P*based on records. Two types of point estimators are developed—uniformly minimum variance unbiased estimators and maximum likelihood estimators. A comparative study of different methods of estimation...

Journal of the Korean Statistical Society > 2016 > 45 > 2 > 314-328

Statistical Papers > 2007 > 48 > 4 > 683-693

_{1}+...+X

_{k}≤ Y} are considered. The random variables X’s and Y are assumed to follow binomial and Poisson distributions. Classical estimators available in the literature are discussed and Bayes estimators are derived. In order to obtain the estimators of these parametric functions, the basic role is played by the estimators of factorial moments...

Statistical Papers > 2003 > 44 > 3 > 301-313

_{r}X > Y are considered for the generalized life distributions. Uniformly minimum variance unbiased estimators (UMVUES) of the powers of the parameter involved in the probabilistic model and the probability density function (pdf) at a specified point are derived. The UMVUE of the pdf is utilized to obtain the UMVUE of the reliability function...

Statistical Papers > 2003 > 44 > 3

Microelectronics Reliability > 1997 > 37 > 6 > 943-948

Microelectronics Reliability > 1997 > 37 > 5 > 815-817

Microelectronics Reliability > 1996 > 36 > 9 > 1305-1308

Microelectronics Reliability > 1996 > 36 > 5 > 637-643

Microelectronics Reliability > 1996 > 36 > 1 > 91-96