Search results for: Xianzhen Yang
Microwave and Optical Technology Letters > 64 > 4 > 676 - 681
Journal of Electronic Testing > 2019 > 35 > 3 > 359-365
Microwave and Optical Technology Letters > 61 > 1 > 163 - 166
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 10 > 2792 - 2794