Search results for: Mauro Ciappa
Microelectronics Reliability > 2010 > 50 > 9-11 > 1750-1757
Microelectronics Reliability > 2010 > 50 > 9-11 > 1407-1412
Microelectronics Reliability > 2010 > 50 > 9-11 > 1621-1625
Solid State Electronics > 2009 > 53 > 11 > 1202-1208
Microelectronics Reliability > 2009 > 49 > 9-11 > 1334-1340
Microelectronics Reliability > 2009 > 49 > 9-11 > 972-976
Microelectronics Reliability > 2009 > 49 > 9-11 > 1278-1282
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 3 > 441
Microelectronics Reliability > 2007 > 47 > 7 > 1044-1053
Microelectronics Reliability > 2005 > 45 > 9-11 > 1532-1537
Microelectronics Reliability > 2005 > 45 > 9-11 > 1293-1298
Microelectronics Reliability > 2002 > 42 > 4-5 > 653-667
Solid State Electronics > 2002 > 46 > 3 > 445-449