Search results for: Ting-En Hsieh
IEEE Journal of the Electron Devices Society > 2018 > 6 > 1 > 110 - 115
IEEE Electron Device Letters > 2014 > 35 > 7 > 735 - 737
IEEE Electron Device Letters > 2014 > 35 > 10 > 1001 - 1003
IEEE Journal of the Electron Devices Society > 2018 > 6 > 1 > 110 - 115
IEEE Electron Device Letters > 2014 > 35 > 7 > 735 - 737
IEEE Electron Device Letters > 2014 > 35 > 10 > 1001 - 1003