Search results for: Javier A. Salcedo
Microelectronics Reliability > 2017 > 79 > C > 201-205
2017 IEEE International Reliability Physics Symposium (IRPS) > EL-4.1 - EL-4.4
IEEE Electron Device Letters > 2016 > 37 > 11 > 1477 - 1480
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 2 > 263 - 265
2016 IEEE International Reliability Physics Symposium (IRPS) > EL-4-1 - EL-4-3
IEEE Transactions on Electron Devices > 2015 > 62 > 12 > 4128 - 4134
Microelectronics Reliability > 2015 > 55 > 11 > 2236-2246
2015 IEEE International Reliability Physics Symposium > EL.3.1 - EL.3.5
Microelectronics Reliability > 2015 > 55 > 1 > 15-23
2014 IEEE International Reliability Physics Symposium > 4C.3.1 - 4C.3.4
2014 IEEE International Reliability Physics Symposium > 4C.4.1 - 4C.4.5
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 4 > 1061 - 1067
IEEE Electron Device Letters > 2014 > 35 > 4 > 437 - 439
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 772 - 774
Microelectronics Reliability > 2014 > 54 > 1 > 57-63