Search results for: R. Ritzenthaler
2017 IEEE International Reliability Physics Symposium (IRPS) > DG-8.1 - DG-8.5
2016 IEEE International Electron Devices Meeting (IEDM) > 17.5.1 - 17.5.4
2016 IEEE International Electron Devices Meeting (IEDM) > 19.7.1 - 19.7.4
2016 IEEE International Electron Devices Meeting (IEDM) > 35.4.1 - 35.4.4
2016 IEEE International Reliability Physics Symposium (IRPS) > 4B-2-1 - 4B-2-7
Materials Science in Semiconductor Processing > 2016 > 42 > Part 2 > 255-258
2015 IEEE International Electron Devices Meeting (IEDM) > 21.8.1 - 21.8.4
2015 IEEE International Electron Devices Meeting (IEDM) > 11.6.1 - 11.6.4
2014 IEEE International Electron Devices Meeting > 32.3.1 - 32.3.4