The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
In his keynote address at the 2007 International Test Conference, Gadi Singer (vice president of the Mobility Group and general manager of the SOC Enabling Group at Intel) provided Intel's perspective on evolving computing trends, continuing and future challenges of nanoscale device integration, the resulting gigascale complexity, and the implications of all this for test.
"Drive only" at speed functional testing is defined to be where the ATE drives input stimulus at native data rates and the results are accumulated or checked on die and the test result is accessed and checked by the automatic test equipment, ATE, at a slow data rate. This paper summarizes the various "drive only" methods and associated DFT circuits that Intel has developed, some...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.