Search results for: Xiuqin Wei
Microelectronics Reliability > 2017 > 74 > C > 15-21
IEEE Transactions on Industrial Electronics > 2017 > 64 > 4 > 3227 - 3238
Journal of Electronic Materials > 2017 > 46 > 2 > 1067-1071
Materials Science in Semiconductor Processing > 2016 > 53 > C > 8-12
Journal of Crystal Growth > 2016 > 443 > C > 15-19
IEEE Transactions on Power Electronics > 2016 > 31 > 1 > 394 - 405
IEEE Transactions on Circuits and Systems I: Regular Papers > 2015 > 62 > 11 > 2781 - 2791
IEEE Transactions on Power Electronics > 2015 > 30 > 7 > 3685 - 3694