Search results for: Chun-chen Yeh
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 3 > 534 - 543
IEEE Electron Device Letters > 2011 > 32 > 6 > 713 - 715
2010 IEEE International Reliability Physics Symposium > 1099 - 1104
IEEE Electron Device Letters > 2008 > 29 > 7 > 778 - 780