Search results for: K. Domanski
NATO Science Series II: Mathematics, Physics and Chemistry > Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment > Novel SOI Devices and Sensors Operating at Harsh Conditions > 291-296
Springer Proceedings in Physics > Microscopy of Semiconducting Materials > Processed Silicon and Other Device Materials > 375-378
2012 International Electron Devices Meeting > 12.5.1 - 12.5.4
Microelectronics Reliability > 2012 > 52 > 11 > 2640-2646
Procedia Engineering > 2012 > 47 > Complete > 841-844
Przegląd Elektrotechniczny > 2010 > R. 86, nr 10 > 17-20
2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) > 6A.3-1 - 6A.3-10
Nuclear Inst. and Methods in Physics Research, A > 2006 > 560 > 1 > 26-30
Nuclear Inst. and Methods in Physics Research, A > 2006 > 560 > 1 > 153-157
Microelectronics Reliability > 2006 > 46 > 5-6 > 689-701