Search results for: HanMing Wu
2016 IEEE International Electron Devices Meeting (IEDM) > 31.5.1 - 31.5.4
IEEE Transactions on Electron Devices > 2016 > 63 > 11 > 4295 - 4301
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 4 > 1333 - 1341
2015 IEEE International Electron Devices Meeting (IEDM) > 22.2.1 - 22.2.4
2015 IEEE International Electron Devices Meeting (IEDM) > 11.7.1 - 11.7.4
2015 IEEE International Reliability Physics Symposium > 5B.7.1 - 5B.7.6
IEEE Electron Device Letters > 2015 > 36 > 1 > 26 - 28
2014 IEEE International Electron Devices Meeting > 12.6.1 - 12.6.4
2014 IEEE International Electron Devices Meeting > 34.5.1 - 34.5.4
2014 IEEE International Electron Devices Meeting > 34.1.1 - 34.1.4
Chinese Science Bulletin > 2014 > 59 > 29-30 > 3935-3942
2013 IEEE International Electron Devices Meeting > 33.5.1 - 33.5.4
2013 IEEE International Electron Devices Meeting > 31.4.1 - 31.4.4
IEEE Transactions on Electron Devices > 2013 > 60 > 12 > 3989 - 3995