Search results for: R. van Silfhout
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 1 > 2 - 8
Nuclear Inst. and Methods in Physics Research, B > 2007 > 261 > 1-2 > 396-400
Microelectronics Reliability > 2006 > 46 > 9-11 > 1679-1684