Search results for: Aaron Thean
IEEE Electron Device Letters > 2017 > 38 > 3 > 318 - 321
Solid-State Electronics > 2017 > 128 > C > 43-47
physica status solidi c > 13 > 10‐12 > 855 - 859
IEEE Transactions on Electron Devices > 2016 > 63 > 12 > 4707 - 4713
physica status solidi (a) > 213 > 11 > 2820 - 2833
IEEE Electron Device Letters > 2016 > 37 > 9 > 1092 - 1095
Solid-State Electronics > 2016 > 123 > C > 124-129
IEEE Electron Device Letters > 2016 > 37 > 8 > 1055 - 1058
IEEE Transactions on Electron Devices > 2016 > 63 > 8 > 3069 - 3075
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2488 - 2496
2016 IEEE International Reliability Physics Symposium (IRPS) > XT-10-1 - XT-10-6
2016 IEEE International Reliability Physics Symposium (IRPS) > 3B-5-1 - 3B-5-7
2016 IEEE International Reliability Physics Symposium (IRPS) > 4B-4-1 - 4B-4-6
IEEE Electron Device Letters > 2016 > 37 > 4 > 363 - 365
IEEE Electron Device Letters > 2016 > 37 > 3 > 337 - 340