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Heavy-ion beam is used to perform Single Event Effects testing on the Flash-based and radiation hardened FPGA, the RT4G150 device. Soft errors due to SEU and SET in the fabric Flip-Flops and PLL generated clocks are measured and analyzed. SEFIs in PLL and SERDES are also observed.
SET and SEFI characterization of the SmartFusion2 flash-based FPGA under heavy ion irradiation is presented. Functional blocks such as the PLL and Microcontroller Sub System are characterized and presented.
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