Search results for: G. Ghibaudo
Journal of Electronic Materials > 2019 > 48 > 10 > 6084-6092
Microelectronics Reliability > 2018 > 87 > C > 106-112
Solid-State Electronics > 2018 > 139 > C > 88-93
Microelectronic Engineering > 2017 > 178 > C > 245-249
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2080 - 2085
Solid-State Electronics > 2017 > 131 > C > 20-23
2017 IEEE International Reliability Physics Symposium (IRPS) > 2B-2.1 - 2B-2.7
2017 IEEE International Reliability Physics Symposium (IRPS) > 3E-4.1 - 3E-4.6
IEEE Electron Device Letters > 2017 > 38 > 3 > 379 - 382
Solid-State Electronics > 2017 > 128 > C > 31-36
Solid-State Electronics > 2017 > 128 > C > 10-16
2016 IEEE International Electron Devices Meeting (IEDM) > 4.5.1 - 4.5.4
Solid-State Electronics > 2016 > 125 > C > 167-174