Search results for: Kalyan Koley
IEEE Transactions on Electron Devices > 2016 > 63 > 10 > 3869 - 3875
Microelectronics Reliability > 2016 > 65 > C > 47-54
IEEE Transactions on Electron Devices > 2016 > 63 > 8 > 3019 - 3027
IEEE Transactions on Electron Devices > 2016 > 63 > 7 > 2700 - 2707
Microelectronics Reliability > 2016 > 61 > C > 99-105
IET Circuits, Devices & Systems > 2016 > 10 > 3 > 201 - 208
Solid-State Electronics > 2016 > 117 > C > 193-198
Microelectronics Journal > 2015 > 46 > 11 > 1082-1090
IEEE Journal of the Electron Devices Society > 2015 > 3 > 5 > 410 - 417
IEEE Transactions on Electron Devices > 2015 > 62 > 6 > 1733 - 1738
Microelectronics Reliability > 2015 > 55 > 2 > 326-331
Superlattices and Microstructures > 2014 > 75 > C > 634-646
Microelectronics Reliability > 2014 > 54 > 6-7 > 1125-1132
Microelectronics Reliability > 2014 > 54 > 6-7 > 1137-1142
IEEE Journal of the Electron Devices Society > 2014 > 2 > 6 > 135 - 144
IET Circuits, Devices & Systems > 2014 > 8 > 6 > 554 - 560
IEEE Transactions on Electron Devices > 2014 > 61 > 4 > 998 - 1005
IEEE Transactions on Electron Devices > 2013 > 60 > 1 > 63 - 69