Search results for: Chong Gun Yu
Frontiers of Information Technology & Electronic Engineering > 2018 > 19 > 2 > 285-296
IEEE Transactions on Electron Devices > 2017 > 64 > 6 > 2526 - 2532
Microelectronics Reliability > 2016 > 64 > C > 215-219
Microelectronics Reliability > 2016 > 64 > C > 570-574
Microelectronics Reliability > 2015 > 55 > 9-10 > 1456-1459
Microelectronics Reliability > 2014 > 54 > 9-10 > 2325-2328
Microelectronics Reliability > 2013 > 53 > 9-11 > 1814-1817
Solid State Electronics > 2013 > 79 > Complete > 253-257
Microelectronics Reliability > 2012 > 52 > 9-10 > 1945-1948
Solid State Electronics > 2012 > 72 > Complete > 88-92
Microelectronics Reliability > 2011 > 51 > 9-11 > 1547-1550
IEEE Electron Device Letters > 2011 > 32 > 3 > 294 - 296
IEEE Electron Device Letters > 2011 > 32 > 9 > 1176 - 1178
Microelectronics Reliability > 2009 > 49 > 9-11 > 994-997
Microelectronic Engineering > 2008 > 85 > 8 > 1717-1722
Solid State Electronics > 2008 > 52 > 5 > 824-829
Microelectronics Reliability > 2007 > 47 > 9-11 > 1411-1415
Solid State Electronics > 2007 > 51 > 3 > 505-510
Microelectronics Reliability > 2006 > 46 > 9-11 > 1864-1867