Search results for: Wolfgang Preuss
Microelectronics Reliability > 1997 > 37 > 8 > 1255-1258
Microelectronics Reliability > 1997 > 37 > 4 > 696-697
Microelectronics Reliability > 1997 > 37 > 2 > 255-265
Microelectronics Reliability > 1996 > 36 > 10 > 1483-1488
Microelectronics Reliability > 1996 > 36 > 10 > 1417-1423
Microelectronics Reliability > 1996 > 36 > 10 > 1389-1394
Microelectronics Reliability > 1996 > 36 > 1 > 9-17
Microelectronics Reliability > 1996 > 36 > 1 > 1-7
Microelectronics Reliability > 1995 > 35 > 12 > 1461-1465
IEEE Transactions on Reliability > 1987 > R-36 > 5 > 551 - 553