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This paper presents the effects of postdeposition annealing temperatures (400, 600, 800, and 1000°C) in oxygen ambient on the metal-organic decomposed CeO2 films spin coated on an n-type GaN substrate. The compositions, structures, and morphologies of these samples are revealed by X-ray diffraction (XRD), field-emission scanning electron microscopy, and an atomic force microscope. XRD analysis discloses...
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