Search results for: R. Ricciari
Microelectronics Reliability > 2015 > 55 > 9-10 > 1800-1803
Microelectronics Reliability > 2015 > 55 > 9-10 > 1617-1621
Surface and Interface Analysis > 46 > 10-11 > 823 - 826
2013 IEEE International Reliability Physics Symposium (IRPS) > 5B.3.1 - 5B.3.7
Crystal Research and Technology > 46 > 8 > 805 - 808
Microelectronics Reliability > 2010 > 50 > 9-11 > 1436-1440
Nuclear Inst. and Methods in Physics Research, B > 2007 > 257 > 1-2 > 257-260