Search results for: B. Domengès
Springer Proceedings in Physics > Microscopy of Semiconducting Materials > Processed Silicon and Other Device Materials > 367-370
2015 European Microwave Conference (EuMC) > 1022 - 1025
2014 44th European Microwave Conference > 1048 - 1051
Microelectronics Reliability > 2011 > 51 > 9-11 > 1693-1696
Materials Science & Engineering B > 2007 > 144 > 1-3 > 1-6
Applied Surface Science > 2007 > 253 > 14 > 6006-6012
Applied Surface Science > 2006 > 253 > 3 > 1143-1149
Microelectronics Reliability > 2005 > 45 > 9-11 > 1639-1644
The European Physical Journal B > 2001 > 21 > 2 > 163-174
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions... > 2000 > 166-167 > C > 927-932
Journal of Solid State Chemistry > 1998 > 139 > 2 > 362-372
Journal of Solid State Chemistry > 1996 > 127 > 2 > 302-307
Journal of Solid State Chemistry > 1996 > 124 > 1 > 1-7
Journal of Solid State Chemistry > 1996 > 122 > 2 > 281-290
Journal of Solid State Chemistry > 1996 > 121 > 1 > 158-166