Search results for: F. Chen
Microelectronics Reliability > 2015 > 55 > 12(PB) > 2727-2747
Microelectronics Reliability > 2008 > 48 > 8-9 > 1375-1383
Microelectronics Reliability > 2006 > 46 > 2-4 > 232-243
Microelectronics Reliability > 1998 > 38 > 3 > 295-308