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The paper reviews different approaches of the semiconductor device and integrated circuit statistical modeling. A backward propagation of variance method has been used to estimate the EKV compact model parameter distributions. A detailed analysis of this approach has been done in terms of efficiency, and accuracy aspects. The determined distributions of the EKV model process parameters responsible...
FinFET devices are extensively investigated due to the prospects for application in the sub-100 nm CMOS integrated circuits fabrication. Small size of the FinFETs and the properties of technological processes strongly influence their electrical characteristics. The random variations of the characteristics lead to a mismatch effect critical from the viewpoint of design and fabrication. In the paper...
A MPW service has been arranged in the ITE in order to offer facility to academies for prototyping of CMOS ICs. This service is based on the proprietary CMOS process. The technology has been characterized via electrical measurements of dedicated test structures. The characteristics have been implemented in the form of design kit. Cadence reg design system has been chosen as a target tool for ICs design...
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