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In order to maintain a small, stable backlog at the router buffer, active queue management (AQM) algorithms drop packets probabilistically at the onset of congestion, leading to backoffs by Transmission Control Protocol (TCP) flows. However, wireless losses may be misinterpreted as congestive losses and induce spurious backoffs. In this paper, we raise the basic question: Can AQM maintain a stable,...
Y/Δ transformer is widely used in power system and the circulation is difficult to measure accurately. This paper mainly discusses how to use the sample data to calculate the circulation of Y/Δ transformer. The method is deduced by the basic equations of transformer and the relationship of transformer currents. It uses numerical integration and trapezoid method to disperse the middle variables and...
The advent of 45 nm technology poses a real challenge to device physical characterization. The shrinkage in dimension makes the characterization of some critical structures very difficult or impossible. The adoption of ultra low K materials even worsens the situation. In this paper, an attempt is made to address some of the challenging characterization issues and some solutions are provided with the...
In this paper, the authors try to introduce three techniques for plane-view TEM sample preparation. First, traditional plane-view TEM sample preparation will be introduced. The second technique is FIB- based lift-out method, which places the sample on the carbon film. This technique is used to cut isolated defects, such as SRAM single bit failure, but this technique introduces artifacts from FIB ion...
The adoption of SOI structure into 90 nm IC devices makes the characterization very challenging. TEM characterization becomes more critical, challenging and indispensable in the failure analysis of such devices. To illustrate the application of TEM in this area, several unique examples including both cross-sectional and planar analysis are given here
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